U. Adem, N. Mufti, A.A. Nugroho, G. Catalan, B. Noheda, T.T.M. Palstra
We have investigated the origin of the dielectric relaxation in YMnO3 single crystals. Two distinct dielectric relaxation features were observed at low (200≤T≤373K) and high (300≤T≤450K) temperatures. Analysis of our detailed frequency, electrode and thickness dependent dielectric measurements and ac conductivity data as well as the use of single crystals allow us to get a comprehensive picture of these relaxations. The low temperature relaxation is attributed to the Maxwell-Wagner type effects originating from the dipoles at the surface while the high temperature one is suggested to originate from hopping of charge carriers resulting from the second ionization of oxygen vacancies. © 2015 Elsevier B.V. All rights reserved.
Zernike Institute for Advanced Materials, University of Groningen, AG Groningen, 9747, Netherlands; Department of Engineering Physics, Faculty of Engineering, Ankara University, Besevler, Ankara, 06100, Turkey; Department of Physics, State University of Malang, Jl. Semarang No. 5, Malang, 65145, Indonesia; Faculty of Mathematics and Natural Sciences, Institut Teknologi Bandung, Jalan Ganesha 10, Bandung, 40132, Indonesia; ICREA - Institucio Catalana de Recerca i Estudis Avançats, Barcelona, 08010, Spain; ICN2 - Institut Catala de Nanociencia i Nanotecnologia, Campus UAB, Bellaterra, Barcelona, 08193, Spain
